201.net Series
Discrete Semiconductor
Test System
For testing power and small signal discrete semiconductors. Tests include . . .
• Leakage Current
• Breakdown Voltages
• Conducting Current
• Optical Intensity
• Component Gains
• On/Off Timing
• Plus many more
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303 Family
Application-specific
Test Systems
303 Systems are designed using a common platform and integrating specialized hardware and software to meet the parametric test needs for . . .
• Electromechanical Relays
• Coaxial Relays
• Opto Devices
• Sidacs
• And others
Contact Us with your specific test needs.
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