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SemiTek test equipment
is designed to test the
electrical integrity of
discrete semiconductor
devices.


To view complete
electrical specifcations,
click on system image.
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   SemiTek International
   870 N Dorothy Drive,
   Suite 714
   Richardson, TX USA 75081
   972-783-8100
   972-783-8293 fax
   info@semitek.com

   INTERNATIONAL              
China     
     



Model 201C
For discrete semiconductors
Image

Designed to test. . .
  • Darlington Transistor
  • Diac
  • Diode
  • Diode - Current Regulation
  • Diode - Schottky
  • IGBT
  • Infrared Emitting Diode
  • JFET
  • Light Emitting Diode
  • MOSFET - Depletion
  • MOSFET - Enhancement
  • Multiple/Matrixed Devices
  • Opto Coupler
  • Opto Interruptor
  • Opto Isolator
  • Photodiode
  • Photo Transistor
  • Relay
  • SCR
  • Solid State Relay
  • Thermistor
  • Thyristor (4 Quadrant)
  • Transistor
  • Voltage Regulator
  • Zener Diode



  • 303-Relay Test System
    For electromechanical relays


    303-Relay Data Sheet

    Designed to test. . .
  • Electromechanical Relays
  • Reed Relays
  • Solid State Relays
  • Safety Relays
  • Switches


  • 303-Sidac Test System
    For circuit protection devices


    Image

    Designed to test. . .
  • Protection Thyristors
  • Sidacs
  • Diacs
  • SCR/Triacs
  • Metal Oxide Varistors
  • Gas Discharge Tubes


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